Speedmattersininspection,processcontrol,ordefectandfailureanalysisforthemicroelectronicsandsemiconductorindustry.Thefasteryoudetectadefect,thefasteryoucanreact.
30%morefieldofview
Withalargefieldofview,theDM3XLinspectionsystemallowsyourteamtoidentifydefectsfasterandincreaseyouryieldrate.Makeuseofthe30%increasedfieldofviewoftheuniquemacroobjective.